管理学报
  Jul. 14, 2025
Home |  About Journal  |  Editorial Board  |  Instruction  |  Subscriptions  |  Advertisement  |  Contacts Us  |  Chinese
J4  2005, Vol. 2 Issue (4): 459-    DOI:
Current Issue| Next Issue| Archive| Adv Search |
Model of the Cycle of Organizational Commitment Level: Its Development and Empirical Study
 HAN Yi, LIAO Jian-Qiao
Huazhong University of Science and Technology; Wuhan; China

Download: PDF (369 KB)   HTML (1 KB) 
Export: BibTeX | EndNote (RIS)      
Abstract  

Organizational commitment has been measured by the scholars in various ways, but the previous theoretical or empirical research devoted to organizational commitment has been based on the assumption that the level of organizational commitment develops with tenure displaying a rapid decrease after entry the organization, followed later by a steady increase. On the basis of the career-cycle development literature, a cycle model of organizational commitment level was presented and the bar charts method used to examine changes in organizational commitment with tenure. In opposition to existing theories and results, the cycle model of organizational commitment level indicated that organizational commitment level with tenure displayed a cycle change, and significantly predicted five stages: shock, identification, steady, rumination and entrenchment periods. As a result, it is important for the organizations to improve the condition of employees' organizational commitment level and reduce employees' turnover.

Key wordscycle      organizational commitment level      affective commitment      continuance commitment      normative commitment     
Received: 12 October 2004     
Service
E-mail this article
Add to my bookshelf
Add to citation manager
E-mail Alert
RSS
Articles by authors
HAN Yi
LIAO Jian-Qiao
Cite this article:   
HAN Yi,LIAO Jian-Qiao. Model of the Cycle of Organizational Commitment Level: Its Development and Empirical Study[J]. J4, 2005, 2(4): 459-.
URL:  
http://manu68.magtech.com.cn/Jwk_glxb/EN/     OR     http://manu68.magtech.com.cn/Jwk_glxb/EN/Y2005/V2/I4/459
Copyright  ©  CHINESE JOURNAL OF MANAGEMENT
Support by Beijing Magtech Co.ltd   support@magtech.com.cn