管理学报
 
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J4  2009, Vol. 6 Issue (7): 957-    DOI:
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Backtesting Market Risk of China Equities Using Expected Shortfall
 FAN Guo-Bin, HUANG Wen-Guang, ZENG Yong
1. The University of Electronic Science and Technology of China, Chengdu, China; 2. Cardiff University, Cardiff, Britain

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